mirror of
https://github.com/FEX-Emu/linux.git
synced 2024-12-14 21:01:29 +00:00
[MTD] OneNAND: Add missing files
Simple bad block table source and header files Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
This commit is contained in:
parent
0255fc1b08
commit
87590e26ff
246
drivers/mtd/onenand/onenand_bbt.c
Normal file
246
drivers/mtd/onenand/onenand_bbt.c
Normal file
@ -0,0 +1,246 @@
|
||||
/*
|
||||
* linux/drivers/mtd/onenand/onenand_bbt.c
|
||||
*
|
||||
* Bad Block Table support for the OneNAND driver
|
||||
*
|
||||
* Copyright(c) 2005 Samsung Electronics
|
||||
* Kyungmin Park <kyungmin.park@samsung.com>
|
||||
*
|
||||
* Derived from nand_bbt.c
|
||||
*
|
||||
* TODO:
|
||||
* Split BBT core and chip specific BBT.
|
||||
*/
|
||||
|
||||
#include <linux/slab.h>
|
||||
#include <linux/mtd/mtd.h>
|
||||
#include <linux/mtd/onenand.h>
|
||||
#include <linux/mtd/compatmac.h>
|
||||
|
||||
/**
|
||||
* check_short_pattern - [GENERIC] check if a pattern is in the buffer
|
||||
* @param buf the buffer to search
|
||||
* @param len the length of buffer to search
|
||||
* @param paglen the pagelength
|
||||
* @param td search pattern descriptor
|
||||
*
|
||||
* Check for a pattern at the given place. Used to search bad block
|
||||
* tables and good / bad block identifiers. Same as check_pattern, but
|
||||
* no optional empty check and the pattern is expected to start
|
||||
* at offset 0.
|
||||
*
|
||||
*/
|
||||
static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td)
|
||||
{
|
||||
int i;
|
||||
uint8_t *p = buf;
|
||||
|
||||
/* Compare the pattern */
|
||||
for (i = 0; i < td->len; i++) {
|
||||
if (p[i] != td->pattern[i])
|
||||
return -1;
|
||||
}
|
||||
return 0;
|
||||
}
|
||||
|
||||
/**
|
||||
* create_bbt - [GENERIC] Create a bad block table by scanning the device
|
||||
* @param mtd MTD device structure
|
||||
* @param buf temporary buffer
|
||||
* @param bd descriptor for the good/bad block search pattern
|
||||
* @param chip create the table for a specific chip, -1 read all chips.
|
||||
* Applies only if NAND_BBT_PERCHIP option is set
|
||||
*
|
||||
* Create a bad block table by scanning the device
|
||||
* for the given good/bad block identify pattern
|
||||
*/
|
||||
static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip)
|
||||
{
|
||||
struct onenand_chip *this = mtd->priv;
|
||||
struct bbm_info *bbm = this->bbm;
|
||||
int i, j, numblocks, len, scanlen;
|
||||
int startblock;
|
||||
loff_t from;
|
||||
size_t readlen, ooblen;
|
||||
|
||||
printk(KERN_INFO "Scanning device for bad blocks\n");
|
||||
|
||||
len = 1;
|
||||
|
||||
/* We need only read few bytes from the OOB area */
|
||||
scanlen = ooblen = 0;
|
||||
readlen = bd->len;
|
||||
|
||||
/* chip == -1 case only */
|
||||
/* Note that numblocks is 2 * (real numblocks) here;
|
||||
* see i += 2 below as it makses shifting and masking less painful
|
||||
*/
|
||||
numblocks = mtd->size >> (bbm->bbt_erase_shift - 1);
|
||||
startblock = 0;
|
||||
from = 0;
|
||||
|
||||
for (i = startblock; i < numblocks; ) {
|
||||
int ret;
|
||||
|
||||
for (j = 0; j < len; j++) {
|
||||
size_t retlen;
|
||||
|
||||
/* No need to read pages fully,
|
||||
* just read required OOB bytes */
|
||||
ret = mtd->read_oob(mtd, from + j * mtd->oobblock + bd->offs,
|
||||
readlen, &retlen, &buf[0]);
|
||||
|
||||
if (ret)
|
||||
return ret;
|
||||
|
||||
if (check_short_pattern(&buf[j * scanlen], scanlen, mtd->oobblock, bd)) {
|
||||
bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
|
||||
printk(KERN_WARNING "Bad eraseblock %d at 0x%08x\n",
|
||||
i >> 1, (unsigned int) from);
|
||||
break;
|
||||
}
|
||||
}
|
||||
i += 2;
|
||||
from += (1 << bbm->bbt_erase_shift);
|
||||
}
|
||||
|
||||
return 0;
|
||||
}
|
||||
|
||||
|
||||
/**
|
||||
* onenand_memory_bbt - [GENERIC] create a memory based bad block table
|
||||
* @param mtd MTD device structure
|
||||
* @param bd descriptor for the good/bad block search pattern
|
||||
*
|
||||
* The function creates a memory based bbt by scanning the device
|
||||
* for manufacturer / software marked good / bad blocks
|
||||
*/
|
||||
static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd)
|
||||
{
|
||||
unsigned char data_buf[MAX_ONENAND_PAGESIZE];
|
||||
|
||||
bd->options &= ~NAND_BBT_SCANEMPTY;
|
||||
return create_bbt(mtd, data_buf, bd, -1);
|
||||
}
|
||||
|
||||
/**
|
||||
* onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
|
||||
* @param mtd MTD device structure
|
||||
* @param offs offset in the device
|
||||
* @param allowbbt allow access to bad block table region
|
||||
*/
|
||||
static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
|
||||
{
|
||||
struct onenand_chip *this = mtd->priv;
|
||||
struct bbm_info *bbm = this->bbm;
|
||||
int block;
|
||||
uint8_t res;
|
||||
|
||||
/* Get block number * 2 */
|
||||
block = (int) (offs >> (bbm->bbt_erase_shift - 1));
|
||||
res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
|
||||
|
||||
DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
|
||||
(unsigned int) offs, block >> 1, res);
|
||||
|
||||
switch ((int) res) {
|
||||
case 0x00: return 0;
|
||||
case 0x01: return 1;
|
||||
case 0x02: return allowbbt ? 0 : 1;
|
||||
}
|
||||
|
||||
return 1;
|
||||
}
|
||||
|
||||
/**
|
||||
* onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
|
||||
* @param mtd MTD device structure
|
||||
* @param bd descriptor for the good/bad block search pattern
|
||||
*
|
||||
* The function checks, if a bad block table(s) is/are already
|
||||
* available. If not it scans the device for manufacturer
|
||||
* marked good / bad blocks and writes the bad block table(s) to
|
||||
* the selected place.
|
||||
*
|
||||
* The bad block table memory is allocated here. It must be freed
|
||||
* by calling the onenand_free_bbt function.
|
||||
*
|
||||
*/
|
||||
int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
|
||||
{
|
||||
struct onenand_chip *this = mtd->priv;
|
||||
struct bbm_info *bbm = this->bbm;
|
||||
int len, ret = 0;
|
||||
|
||||
len = mtd->size >> (this->erase_shift + 2);
|
||||
/* Allocate memory (2bit per block) */
|
||||
bbm->bbt = kmalloc(len, GFP_KERNEL);
|
||||
if (!bbm->bbt) {
|
||||
printk(KERN_ERR "onenand_scan_bbt: Out of memory\n");
|
||||
return -ENOMEM;
|
||||
}
|
||||
/* Clear the memory bad block table */
|
||||
memset(bbm->bbt, 0x00, len);
|
||||
|
||||
/* Set the bad block position */
|
||||
bbm->badblockpos = ONENAND_BADBLOCK_POS;
|
||||
|
||||
/* Set erase shift */
|
||||
bbm->bbt_erase_shift = this->erase_shift;
|
||||
|
||||
if (!bbm->isbad_bbt)
|
||||
bbm->isbad_bbt = onenand_isbad_bbt;
|
||||
|
||||
/* Scan the device to build a memory based bad block table */
|
||||
if ((ret = onenand_memory_bbt(mtd, bd))) {
|
||||
printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
|
||||
kfree(bbm->bbt);
|
||||
bbm->bbt = NULL;
|
||||
}
|
||||
|
||||
return ret;
|
||||
}
|
||||
|
||||
/*
|
||||
* Define some generic bad / good block scan pattern which are used
|
||||
* while scanning a device for factory marked good / bad blocks.
|
||||
*/
|
||||
static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
|
||||
|
||||
static struct nand_bbt_descr largepage_memorybased = {
|
||||
.options = 0,
|
||||
.offs = 0,
|
||||
.len = 2,
|
||||
.pattern = scan_ff_pattern,
|
||||
};
|
||||
|
||||
/**
|
||||
* onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
|
||||
* @param mtd MTD device structure
|
||||
*
|
||||
* This function selects the default bad block table
|
||||
* support for the device and calls the onenand_scan_bbt function
|
||||
*/
|
||||
int onenand_default_bbt(struct mtd_info *mtd)
|
||||
{
|
||||
struct onenand_chip *this = mtd->priv;
|
||||
struct bbm_info *bbm;
|
||||
|
||||
this->bbm = kmalloc(sizeof(struct bbm_info), GFP_KERNEL);
|
||||
if (!this->bbm)
|
||||
return -ENOMEM;
|
||||
|
||||
bbm = this->bbm;
|
||||
|
||||
memset(bbm, 0, sizeof(struct bbm_info));
|
||||
|
||||
/* 1KB page has same configuration as 2KB page */
|
||||
if (!bbm->badblock_pattern)
|
||||
bbm->badblock_pattern = &largepage_memorybased;
|
||||
|
||||
return onenand_scan_bbt(mtd, bbm->badblock_pattern);
|
||||
}
|
||||
|
||||
EXPORT_SYMBOL(onenand_scan_bbt);
|
||||
EXPORT_SYMBOL(onenand_default_bbt);
|
122
include/linux/mtd/bbm.h
Normal file
122
include/linux/mtd/bbm.h
Normal file
@ -0,0 +1,122 @@
|
||||
/*
|
||||
* linux/include/linux/mtd/bbm.h
|
||||
*
|
||||
* NAND family Bad Block Management (BBM) header file
|
||||
* - Bad Block Table (BBT) implementation
|
||||
*
|
||||
* Copyright (c) 2005 Samsung Electronics
|
||||
* Kyungmin Park <kyungmin.park@samsung.com>
|
||||
*
|
||||
* Copyright (c) 2000-2005
|
||||
* Thomas Gleixner <tglx@linuxtronix.de>
|
||||
*
|
||||
*/
|
||||
#ifndef __LINUX_MTD_BBM_H
|
||||
#define __LINUX_MTD_BBM_H
|
||||
|
||||
/* The maximum number of NAND chips in an array */
|
||||
#define NAND_MAX_CHIPS 8
|
||||
|
||||
/**
|
||||
* struct nand_bbt_descr - bad block table descriptor
|
||||
* @param options options for this descriptor
|
||||
* @param pages the page(s) where we find the bbt, used with
|
||||
* option BBT_ABSPAGE when bbt is searched,
|
||||
* then we store the found bbts pages here.
|
||||
* Its an array and supports up to 8 chips now
|
||||
* @param offs offset of the pattern in the oob area of the page
|
||||
* @param veroffs offset of the bbt version counter in the oob are of the page
|
||||
* @param version version read from the bbt page during scan
|
||||
* @param len length of the pattern, if 0 no pattern check is performed
|
||||
* @param maxblocks maximum number of blocks to search for a bbt. This number of
|
||||
* blocks is reserved at the end of the device
|
||||
* where the tables are written.
|
||||
* @param reserved_block_code if non-0, this pattern denotes a reserved
|
||||
* (rather than bad) block in the stored bbt
|
||||
* @param pattern pattern to identify bad block table or factory marked
|
||||
* good / bad blocks, can be NULL, if len = 0
|
||||
*
|
||||
* Descriptor for the bad block table marker and the descriptor for the
|
||||
* pattern which identifies good and bad blocks. The assumption is made
|
||||
* that the pattern and the version count are always located in the oob area
|
||||
* of the first block.
|
||||
*/
|
||||
struct nand_bbt_descr {
|
||||
int options;
|
||||
int pages[NAND_MAX_CHIPS];
|
||||
int offs;
|
||||
int veroffs;
|
||||
uint8_t version[NAND_MAX_CHIPS];
|
||||
int len;
|
||||
int maxblocks;
|
||||
int reserved_block_code;
|
||||
uint8_t *pattern;
|
||||
};
|
||||
|
||||
/* Options for the bad block table descriptors */
|
||||
|
||||
/* The number of bits used per block in the bbt on the device */
|
||||
#define NAND_BBT_NRBITS_MSK 0x0000000F
|
||||
#define NAND_BBT_1BIT 0x00000001
|
||||
#define NAND_BBT_2BIT 0x00000002
|
||||
#define NAND_BBT_4BIT 0x00000004
|
||||
#define NAND_BBT_8BIT 0x00000008
|
||||
/* The bad block table is in the last good block of the device */
|
||||
#define NAND_BBT_LASTBLOCK 0x00000010
|
||||
/* The bbt is at the given page, else we must scan for the bbt */
|
||||
#define NAND_BBT_ABSPAGE 0x00000020
|
||||
/* The bbt is at the given page, else we must scan for the bbt */
|
||||
#define NAND_BBT_SEARCH 0x00000040
|
||||
/* bbt is stored per chip on multichip devices */
|
||||
#define NAND_BBT_PERCHIP 0x00000080
|
||||
/* bbt has a version counter at offset veroffs */
|
||||
#define NAND_BBT_VERSION 0x00000100
|
||||
/* Create a bbt if none axists */
|
||||
#define NAND_BBT_CREATE 0x00000200
|
||||
/* Search good / bad pattern through all pages of a block */
|
||||
#define NAND_BBT_SCANALLPAGES 0x00000400
|
||||
/* Scan block empty during good / bad block scan */
|
||||
#define NAND_BBT_SCANEMPTY 0x00000800
|
||||
/* Write bbt if neccecary */
|
||||
#define NAND_BBT_WRITE 0x00001000
|
||||
/* Read and write back block contents when writing bbt */
|
||||
#define NAND_BBT_SAVECONTENT 0x00002000
|
||||
/* Search good / bad pattern on the first and the second page */
|
||||
#define NAND_BBT_SCAN2NDPAGE 0x00004000
|
||||
|
||||
/* The maximum number of blocks to scan for a bbt */
|
||||
#define NAND_BBT_SCAN_MAXBLOCKS 4
|
||||
|
||||
/*
|
||||
* Constants for oob configuration
|
||||
*/
|
||||
#define ONENAND_BADBLOCK_POS 0
|
||||
|
||||
/**
|
||||
* struct bbt_info - [GENERIC] Bad Block Table data structure
|
||||
* @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
|
||||
* @param badblockpos [INTERN] position of the bad block marker in the oob area
|
||||
* @param bbt [INTERN] bad block table pointer
|
||||
* @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
|
||||
* @param priv [OPTIONAL] pointer to private bbm date
|
||||
*/
|
||||
struct bbm_info {
|
||||
int bbt_erase_shift;
|
||||
int badblockpos;
|
||||
int options;
|
||||
|
||||
uint8_t *bbt;
|
||||
|
||||
int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
|
||||
|
||||
/* TODO Add more NAND specific fileds */
|
||||
struct nand_bbt_descr *badblock_pattern;
|
||||
|
||||
void *priv;
|
||||
};
|
||||
|
||||
/* OneNAND BBT interface */
|
||||
extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
|
||||
extern int onenand_default_bbt(struct mtd_info *mtd);
|
||||
|
||||
#endif /* __LINUX_MTD_BBM_H */
|
Loading…
Reference in New Issue
Block a user