适配TDD执行HATS测试套

Signed-off-by: deveco_xdevice <liguangjie1@huawei.com>
This commit is contained in:
deveco_xdevice 2022-12-14 19:45:07 +08:00
parent 839c9cb6c9
commit 3e7bc04326

View File

@ -47,7 +47,8 @@ TEST_TYPE_DICT = {"DEX": DeviceTestType.dex_test,
"JST": DeviceTestType.jsunit_test,
"OHJST": DeviceTestType.oh_jsunit_test,
"CXX": DeviceTestType.cpp_test,
"BIN": DeviceTestType.lite_cpp_test}
"BIN": DeviceTestType.lite_cpp_test,
"LTPPosix": DeviceTestType.ltp_posix_test}
EXT_TYPE_DICT = {".dex": DeviceTestType.dex_test,
".hap": DeviceTestType.hap_test,
".apk": DeviceTestType.hap_test,