Made InstanceWrapper and DeviceWrapper simpler to use by moving them to test_environment
then making the Create() member functions and doing the gtest assertions in the function
itself.
Additionally:
Removed the `detail` namespace in the test_environment.
Renamed get_new_test_icd/layer to just `reset_icd/layer`. This is clearer about what it
is doing and makes the interface more expressive with code such as
`env->reset_icd().SetMinInterfaceVersion(5);`
The test used to only keep track of the maximum number of allocations and fail
if it was exceeded, as calling free would decrease this number. Now tests use
the total number of times allocate was called, and realloc was added to this
metric. This should offer better OOM coverage due to failing at each and
every possible OOM place. The code does make sure not to increase the count
if realloc was called to 'downsize' the allocation, which shouldn't cause
OOM to occur ever.
This test tries to recreate an out of memory condition which causes
a binary of the wrong type to be confused with a valid binary, which
causes VK_ERROR_INCOMPATIBLE_DRIVER to be returned instead of VK_SUCCESS
(Or OOM if the case may be)
Charles Giessen